PELCO X-Checker^®

Monitor Energy Dispersive Spectrometer/SEM Systems
The updated PELCO X-Checker^® is a calibration aid to help you monitor the performance of your EDS X-ray system on an SEM. The PELCO X-Checker^® contains a series of standard materials on your choice of aluminum mount. With PELCO X-Checker^®, you can check your detector resolution and calibration, test for contamination on the detector window, monitor low-end sensitivity, and calibrate your image analysis software. When was the last time you checked the performance of your EDS system?
The #602-01 contains:

• Manganese to measure full width at half max (FWHM) detector resolution
• Aluminum and copper to check spectral calibration
• Carbon to monitor calibration at the low end of the spectrum for thin window detectors.
• Nickel TEM grid sizes, 40 x 40µm and 18 x 18µm, with ±5% accuracy, are furnished for checking image analysis software calibration. They also facilitate an easy test for monitoring the amount of vacuum pump oil contamination on the detector window